Publications

Journals

  • 2013
    • Costas Argyrides, Pedro Reviriego, Juan Antonio Maestro: Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors. IEEE Transactions on Reliability 62(1): 238-243 (2013)
  • 2012
    • Pedro Reviriego, Costas Argyrides, , Juan Antonio Maestro: Efficient error detection in Double Error Correction BCH codes for memory applications. Microelectronics Reliability 52(7): 1528-1530 (2012)
  • 2011
    • P. Reviriego, Costas Argyrides,  J. A. Maestro, D. K. Pradhan “Improving Memory Reliability against Soft Errors Using Block Parity ” IEEE Transactions on Nuclear Sciences. Volume 58, Issue 3, Page(s) 981 – 986, June 2011.
    • Juan Antonio Maestro, Pedro Reviriego, Costas Argyrides, , Dhiraj K. Pradhan: Fault Tolerant Single Error Correction Encoders. J. Electronic Testing 27(2): 215-218 (2011)
    • Costas Argyrides, F. Vargas, D. K. Pradhan “Reliability Analysis of H-Tree RAM Memories Implemented with BICS and Parity Codes for Multiple-Bit Upset Correction”  IEEE Transactions on Reliability 60(3): 528-537 (2011)
    • Costas Argyrides, D. K. Pradhan, T. Kocak “Matrix Codes for Reliable and Cost Efficient Memory Chips” IEEE Transactions on VLSI Syst. 19(3): 420-428 (2011)
  • 2010
    • Costas Argyrides, P. Reviriego, D. K. Pradhan, J. A. Maestro “Matrix-Based Codes for Adjacent Error Correction” IEEE Transactions on Nuclear Sciences, Vol 57, no. 4, pages 2106 – 2111, Aug 2010.
  • 2009
    • J Mathew, A Jabir, H. Rahaman, Costas Argyrides, D. K. Pradhan, “On the Synthe-sis of Bit-Parallel Galois Field Multipliers with On-line SEC and DED.”International Journal of Electronics

Conference And Workshop Proceedings:

  • 2011
    • Costas Argyrides,  R. Fereira, C. A. Lisboa, L. Carro “Decimal Hamming: A Novel Software-Implemented Technique to Cope with Soft Errors” 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011), September 2011.
  • 2010
    • Costas Argyrides,  “Improving Reliability for Bit Parallel Finite Field Multipliers Using Decimal Hamming” East West Design and Test Symposium 2010 (EWDTS 2010), September 24-27, St. Petersburg, Russia
    • P. Reviriego, Costas Argyrides, J. A. Maestro and D. K. Pradhan “Enabling Performance versus Reliability Tradeoffs in Memories Using Block Parity” 11th European Conference on Radiation Effects on Components and Systems – RADECS 2010 September 20-24, Austria.
    • J. Fernando, Costas Argyrides, C. A. Lisboa, L. Carro “Multiple Bit Error Detection and Correction in Memory ” EUROMICRO Digital System Design, September 2010.
    • Costas Argyrides, D. K. Pradhan “Improved Yield in Nan-otechnology Circuits using Non-square Meshes” IEEE Commputer Society Annual VLSI Symposium (ISVLSI 2010), July 2010.
    • Costas Argyrides, C. A. Lisboa, D. K. Pradhan, L. Carro “ Evaluation of a New Low Cost Software Level Fault Tolerance Technique to Cope with Soft Errors ” 10th IEEE Latin-American Test Workshop (LATW 2010), March 2010.
  • 2009
    • Costas Argyrides, C. A. Lisboa, D. K. Pradhan, L. Carro “A Fast Error Correction Technique for Matrix Multiplication Algorithms” At the  IEEE International On-Line Testing Symposium, Lisbon, Portugal, 24-27 June, 2009
    • Costas Argyrides, C. A. Lisboa, A. Al-Yamani, D. K. Pradhan, L. Carro “Increasing Memory Yield in Future Technologies through Innovative Design” IEEE International Symposium on Quality Electronic Design (ISQED 09), 16-18, March 2009.
    • Costas Argyrides, C. A. Lisboa, A. Al-Yamani, D. K. Pradhan, L. Carro “Single Element Correction in Sorting Algorithms with Minimum Delay Overhead” 10th IEEE Latin-American Test Workshop (LATW09), 2-5, March 2009.
    • Costas Argyrides, C. A. Lisboa, D. K. Pradhan, L. Carro “Minimizing the Recomputation Time in Soft Error Tolerant Matrix Multiplication Algorithms” At the 1st HiPEAC Workshop on Design for Reliability (DFR09), 25, Jan 2009.
    • Costas Argyrides, D. K. Pradhan “Multiple Event Upsets Aware FPGAs Using Protected Schemes” Daghstul proceedings for 2009.
  • 2008
    • Costas Argyrides, H.R. Zarandi and D. K. Pradhan “Multiple SEU Tolerance in LUTs of FPGAs Using Protected Schemes” 8th European Workshop on Radiation Effects on Components and Systems (RADECS08), Sept. 2008.
    • Costas Argyrides, Fabian Vargas, Dhiraj Pradhan, Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. IEEE International On-Line Testing Symposium, Rhodes, Greece, 3-6 July 2008
    • Costas Argyrides, Stephania Loizidou Himona, Dhiraj Pradhan “Area Reliability trade-off in Improved Reed Muller Coding” SAMOS VIII Workshop, SAMOS VIII, in Samos, Greece, July 21-24, 2008
    • Costas Argyrides, Stephania Loizidou Himona, Dhiraj Pradhan “ Yield Improvement and Power Aware Low Cost Memory Chips”   Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies at Computing Frontiers 2008, Ischia, Italy, May 3-5 , 2008
    • Carlo Lisboa, Costas Argyrides, Dhiraj Pradhan, Luigi Carro, Algorithm Level Fault Tolerance: a Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms. IEEE VLSI Test Symposium (VTS) 2008, San Diego California, USA, 27th April 2008
    • Costas Argyrides, Fabian Vargas, Dhiraj Pradhan, Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement, Proceedings of IEEE Latin American Test Workshop (LATW), Puebla Mexico, 17-20 February 2008.
    • J. Mathew, Costas Argyrides, A. M Jabir, D. K. Pradhan “Single Error Correcting Finite Field Multipliers over GF(2m)”, Proceedings of 21st Conference on VLSI Design (VLSI 08), Hyderabad, India, 4-8 Jan 2008
  • 2007
    • Costas Argyrides, Lisbôa, C., Carro, L., D.K. Pradhan  “Working at Algorithm Level to Minimize Recomputation Time when Coping with Long Duration Transients” DECIDE 2007, Rio, Brasil December 15-17, 2007
    • Costas Argyrides, D. K. Pradhan, A. Al-Yamani “High Defect Tolerant Low Cost Memory Chips”, Proceedings of  IEEE International System on Chip  Conference (SOCC 07), Hsinchu, Taiwan, 26-29 Sept. 2007
    • Costas Argyrides, D.K. Pradhan “Improved Decoding Algorithm for High Reliable Reed Muller Coding” Proceedings of  IEEE International System on Chip  Conference (SOCC 07), Hsinchu, Taiwan, 26-29 Sept. 2007
    • Costas Argyrides, H.R. Zarandi, D.K. Pradhan, “Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories” Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 2007, Rome, Italy, 26-28 Sept  2007
    • Costas Argyrides, D.K. Pradhan  “Novel Soft Error Robust Power Aware Memory Designs” International IEEE East West Design & Test Symposium (EWDTS’ 07), Yerevan, Armenia, 7-10 September 2007.
    • Costas Argyrides, D.K. Pradhan “Yield Improvement for High Defect Rate Nanotechnology Circuits” EWDTS’ 07, Yerevan, Armenia, 7-10 September 2007.
    • Costas Argyrides, Lisbôa, C., Carro, L., D.K. Pradhan “A Soft Error Robust and Power Aware Memory Design”, in Proceedings of the 20th Symposium on Integrated Circuits and Systems Design – SBCCI 2007, September 2007.
    • Costas Argyrides, D.K. Pradhan, “Highly Reliable Power Aware Memory Design” Proceedings of IEEE International On-Line Testing Symposium 2007 (IOLTS), Hersonisos of Heraklion, Crete, Greece, July 20-24, 2007.
    • Costas Argyrides, “High Defect Tolerant Robust Memory Designs” Proceedings of DSN Student Forum, Edinburgh, UK, June 25-28, 2007.
    • H.R. Zarandi, S.G. Miremadi, Costas Argyrides, D.K. Pradhan, ” Online Detection and Correction of Soft-Errors in LUTs of SRAM-based FPGAs” Proceedings of European Test Symposium (ETS), Freiburg, Germany, May 20-24, 2007.
    • Costas Argyrides, H.R. Zarandi, D.K. Pradhan, An “Efficient Method to Tolerate Multiple Bit Upsets in SRAM Memory” Proceedings of European Test Symposium (ETS), Freiburg, Germany, May 20-24, 2007
    • Costas Argyrides, H.R. Zarandi, D.K. Pradhan, “Multiple Upsets Tolerance in SRAM Memory, “Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS), New Orleans, USA, 27-30 May, 2007.
    • H.R. Zarandi, S.G. Miremadi, Costas Argyrides, D.K. Pradhan, “CLB-based Detection and Correction of Bit-flip faults in SRAM-based FPGAs , ” Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS) , New Orleans, USA, 27-30 May, 2007.
    • Costas Argyrides, Ramsundar S, D. K. Pradhan, A. Al-Yamani “Non-square Meshes for Improved Yield in Nanotechnology Circuits” Proceedings of IEEE Latin American Test Workshop (LATW), Cuzco, Peru, 11 – 14, March 2007
    • Costas Argyrides, Demetriou S, D. K. Pradhan, “Fast Reed Muller Decoding for Multi-Bit Upset Aware Memory Designs ” Proceedings of IEEE Latin American Test Workshop (LATW), Cuzco, Peru, 11 – 14, March2007
    • H.R. Zarandi, S.G. Miremadi, Costas Argyrides, D.K. Pradhan, “Fast SEU Detection and LUT Configuration Bits of SRAM-based FPGAs, ” Proceedings of 14th IEEE Reconfigurable Architecture Workshop, in association with IPDPS, California, USA, 26-27 March, 2007.
  • 2006
    • Costas Argyrides, Jimson Mathew, Ahmad A. Al-Yamani, Dhiraj K. Pradhan “Performance Analysis of an Error Tolerant Low Power Memory Architecture” IEEE International Design and Test Workshop, 19-20 November 2006, Dubai
    • Bijoy A.J. , Babita R. J. , Juothish S, Costas Argyrides, J. Mathew, “A Fault Tolerant Multiplier less Decimation Filter” International Conference on Embedded Systems, Mobile Communication and Computing, August 4th -5th 2006, Bangalore, India. (Best Paper Award)

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