Title: ISQED 2009
Location: Double Tree, San Jose, CA, USA
Link out: Click here
Description: The International Symposium on Quality Electronic Design (ISQED)
Start Date: 2009-03-16
End Date: 2009-03-18
Archive for the ‘Uncategorized’ category
ISQED 2009
February 26th, 2009Paris
February 19th, 2009Title: Paris
Location: Paris
Description: Holidays to Paris.
Start Date: 2009-02-21
End Date: 2009-02-25
LATW 2009
February 18th, 2009Title: LATW 2009
Location: Rio de Janeiro, Brazil
Link out: Click here
Description: The Latin-American Test Workshop 2009
Date: 2009-03-02
HiPEAC 2009
January 16th, 2009Title: HiPEAC 2009
Location: Paphos, CYPRUS
Link out: Click here
Description: The 4th International Conference on High Performance and Embedded Architectures and Compilers
Start Date: 2009-01-25
End Date: 2009-01-28
DFR at HiPEAC
December 17th, 2008Title: DFR at HiPEAC
Location: Pafos, Cyprus
Link out: Click here
Description: Design for Reliability workshop at in conjunction with The 4th International Conference on High Performance and Embedded Architectures and Compilers, January 25-28, 2009 Paphos, CYPRUS. I have to go there and present a paper.
Start Time: 10:00
Date: 2009-01-25
14th IEEE European Test Symposium (ETS)
December 16th, 2008Title: 14th IEEE European Test Symposium (ETS)
Location: Sevilla Spain
Link out: Click here
Description: The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2009, ETS will take place in the nice town of Sevilla, Spain.
Start Date: 2009-05-25
End Date: 2009-05-29
10th IEEE Latin-American Test Workshop
December 16th, 2008Title: 10th IEEE Latin-American Test Workshop
Location: LATW2009 will be held in Búzios, Brazil.
Link out: Click here
Description: The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind.
Date: 2009-03-02